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Topics of CLAD Exam
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- Acquiring DCLAD
- Implementing a VI
- Common Design Techniques and Patterns
- Navigating LabVIEW
- Creating and distributing apps
- Developing Modular Apps
- Relating DCLAD
- Instrument Control
- Storing Measurement DCLAD
- Communicating among multiple Loops
- Improving and existing VI
- Advanced File I/O techniques
- Problem Solving with LabVIEW
- Trouble Shooting and Debugging Vis
- Event Programming
- Controlling the User Interface
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NI CLAD日本語 Exam Syllabus Topics:
| Section | Weight | Objectives |
|---|---|---|
| Topic 1: Block Diagram | 20% | - Structures (While Loop, For Loop, Case Structure) - Terminals and nodes - Shift registers - Wires and data types - Functions palette |
| Topic 2: Arrays and Clusters | 15% | - Auto-indexing - Cluster functions - Cluster concepts - Array functions and operations |
| Topic 3: Modular Programming | 10% | - Icon and connector pane - VI Reentrancy - Creating subVIs |
| Topic 4: Debugging and Troubleshooting | 10% | - Error handling - Probe tool - Execution highlighting - Breakpoints and step debugging |
| Topic 5: LabVIEW Environment | 10% | - Using palettes and menus - Creating and saving VIs - Using Help resources - Navigating the LabVIEW environment |
| Topic 6: Front Panel Objects | 15% | - Controls and indicators - Boolean controls - Numeric controls and indicators - String and path controls - Clusters and cluster controls |
| Topic 7: Dataflow Programming | 20% | - Order of operations - Dataflow execution model - Parallel execution |
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